主營(yíng)產(chǎn)品：圓形水浴氮吹儀,平行濃縮儀,玻璃反射測(cè)試儀
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| 品牌 | 析譜 | 光譜帶寬 | 1.8nm |
|---|---|---|---|
| 波長(zhǎng)準(zhǔn)確度 | 0.5nm | 雜散光(S.L.) | 0.02%T |
| 波長(zhǎng)范圍 | 190-1100nm | 自動(dòng)程度 | 自動(dòng)波長(zhǎng) |
| 接收器類(lèi) | 光電倍增管（PMT） | 儀器結(jié)構(gòu) | 雙波長(zhǎng) |
| 價(jià)格區(qū)間 | 5千-1萬(wàn) | 應(yīng)用領(lǐng)域 | 環(huán)保,生物產(chǎn)業(yè),石油,能源,制藥/生物制藥 |
冷卻液氯離子自動(dòng)檢測(cè)儀紫外可見(jiàn)分光光度計(jì)介紹：
所輸入的因子個(gè)數(shù)與所選擇的曲線擬合方法有關(guān)，下表是其對(duì)應(yīng)關(guān)系：
曲線擬合方法 | 曲線方程表達(dá)式 | 所需輸入的因子數(shù) |
一階線性過(guò)零擬合 | C=K1×A | K1, r* |
一階線性擬合 | C=K0+K1×A | K0,K1,r* |
二階擬合 | C=K0+K1×A+K2×A2 | K0,K1,K2 |
三階擬合 | C=K0+K1×A+K2×A2+K3×A3 | K0,K1,K2,K3 |
試驗(yàn)前的準(zhǔn)備
? 將試驗(yàn)用比色皿或試管用蒸餾水或其他專(zhuān)門(mén)的清洗劑清洗干凈，并用柔軟的棉布或紙巾將其表面的手指印或滴液擦試干凈；
? 將盛參比液的比色皿放入4聯(lián)手動(dòng)樣品架（紫外可見(jiàn)分光光度計(jì)系列）或固定單個(gè)樣品架（對(duì)于雙光束紫外可見(jiàn)分光光度計(jì)）最靠近你的槽位中，再將推桿向前推到頭使比色皿正對(duì)光路，關(guān)上樣品室蓋；
Appendix B
Correction Methods
A number of correction techniques can be used to eliminate or reduce interference errors.In general,if the source of the error is known and is consistent from sample to sample.the error can be eliminated.On the other hand,if the source is unkown and varies from sample to sample,the error can be reduced but not eliminated.Correction techniques can always require data from at least two wavelengths. The more sophisticated correction techniques require multiwavelenghth or spectral data.
A.1 Isoabsorbance
When a known interfering component with a known spectrum is present,the error introduced by this component at the analytical wavelength for the target analyte can be eliminated by selecting a reference wavelength at which the interfering compound exhibits the same absorbance as it does at the analytical wavelength.The absorbance at this reference wavelength is subtracted from the absorbance at the analytical wavelength,as shown in Figure A1.The residual absorbance is the ture absorbance of the analyte.
This technique is less reliable when the spectra of the analyte and of the interferent are highly similar.Moreover,it can correct for only one interference
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上海析譜儀器有限公司是專(zhuān)業(yè)從事實(shí)驗(yàn)室科學(xué)儀器自主研發(fā)、生產(chǎn)、銷(xiāo)售和服務(wù)一體的技術(shù)企業(yè)。公司坐落于上海市松江區(qū)久富經(jīng)濟(jì)開(kāi)發(fā)區(qū)。公司成立于2012年，公司主營(yíng)實(shí)驗(yàn)室常用儀器，光譜分析儀器-紫外可見(jiàn)分光光度計(jì)、可見(jiàn)分光光度計(jì)、雙光束紫外可見(jiàn)分光光度計(jì)、火焰光度計(jì)、薄膜固體測(cè)試儀、氮吹儀、固相萃取、索氏提取器，酸度計(jì)、天平、實(shí)驗(yàn)室耗材、配件、配套標(biāo)準(zhǔn)試劑盒等。
